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首页 / Microscope / 产品详情-Flatness measurement system FMS200
Flatness measurement system FMS200
  • Maximum detectable sample diameter: 200 mm
  • Suitable for measuring non-reflective surfaces in the semiconductor industry
  • Each fringe corresponds to a height of 0.8 μm
  • Supports measurement of surfaces with roughness up to 500 nm
  • Rapid
  • non-destructive measurement
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Beijing Aimuxi Semiconductor Technology Co., Ltd
地址：北京市丰台区科学城星火路11号
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MCF Technologies Ltd., (Beijing)
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